Utilize este identificador para referenciar este registo: http://hdl.handle.net/10400.1/6610
Título: The effect of water related traps on the reliability of organic based transistors
Autor: Gomes, Henrique L.
Stallinga, Peter
Colle, M.
Biscarini, F.
De Leeuw, D. M.
Data: 2006
Editora: Elsevier
Resumo: The electrical stability of metal-insulator semiconductor (MIS) capacitors and field-effect transistor structures based in organic semiconductors were investigated. The device characteristics were studied using steady state measurements AC admittance measurements as well as techniques for addressing trap states. Temperature-dependent measurements show clear evidence that an electrical instability occurs above 200 K and is caused by an electronic trapping process. Experimental results show that water is responsible for the trapping mechanism. (c) 2006 Elsevier B.V. All rights reserved.
Peer review: yes
URI: http://hdl.handle.net/10400.1/6610
DOI: https://dx.doi.org/10.1016/j.jnoncrysol.2005.10.069
ISSN: 0022-3093
Aparece nas colecções:FCT2-Artigos (em revistas ou actas indexadas)



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