Utilize este identificador para referenciar este registo: http://hdl.handle.net/10400.1/6615
Título: Trap states as an explanation for the Meyer-Neldel rule in semiconductors
Autor: Stallinga, Peter
Gomes, Henrique L.
Data: 2005
Editora: Elsevier
Resumo: It is shown that whenever traps, distributed exponentially in energy, are governing the conduction in electrical materials, a Meyer-Neldel observation is expected. This is a direct result of the model incorporating a high density of traps by Shur and Hack. Since this type of conduction is common for low mobility materials, such as organic semiconductors or amorphous silicon, they are therefore likely to obey the Meyer-Neldel rule. (C) 2005 Elsevier B.V. All rights reserved.
Peer review: yes
URI: http://hdl.handle.net/10400.1/6615
DOI: https://dx.doi.org/10.1016/j.orgel.2005.03.008
ISSN: 1566-1199
Aparece nas colecções:FCT2-Artigos (em revistas ou actas indexadas)



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