Utilize este identificador para referenciar este registo: http://hdl.handle.net/10400.1/6640
Título: Interface state mapping in a Schottky barrier of the organic semiconductor terrylene
Autor: Stallinga, Peter
Gomes, Henrique L.
Murgia, M.
Mullen, K.
Data: 2002
Editora: Elsevier
Resumo: In this work we quantitatively map interface states in energy in a Schottky barrier between aluminum and the vacuum sublimed organic semiconductor terrylene. The density map of these interface states was extracted from the, admittance spectroscopy data. They revealed an interface state density of 2 x 10(12). cm(-2)eV(-1) close to the valence band which decreases slightly towards midgap. Additional do measurements show that the semiconductor bulk activation energy is 0.33 eV which may correspond to an acceptor level. (C) 2002 Elsevier Science B.V. All rights reserved.
Peer review: yes
URI: http://hdl.handle.net/10400.1/6640
DOI: https://dx.doi.org/10.1016/S1566-1199(02)00024-1
ISSN: 1566-1199
Aparece nas colecções:FCT2-Artigos (em revistas ou actas indexadas)



FacebookTwitterDeliciousLinkedInDiggGoogle BookmarksMySpace
Formato BibTex MendeleyEndnote Degois 

Todos os registos no repositório estão protegidos por leis de copyright, com todos os direitos reservados.