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Effect of oxygen on the electrical characteristics of field effect transistors formed from electrochemically deposited films of poly(3-methylthiophene)

dc.contributor.authorTaylor, D. M.
dc.contributor.authorGomes, Henrique L.
dc.contributor.authorUnderhill, A. E.
dc.contributor.authorEdge, S.
dc.contributor.authorClemenson, P. I.
dc.date.accessioned2015-06-26T14:18:45Z
dc.date.available2015-06-26T14:18:45Z
dc.date.issued1991
dc.description.abstractField effect devices have been formed in which the active layer is a thin film of poly(3-methylthiophene) grown electrochemically onto preformed source and drain electrodes. Although a field effect is present after electrochemical undoping, stable device characteristics with a high modulation ratio are obtained only after vacuum annealing at an elevated temperature, and only then if the devices are held in vacuo. The polymer is shown to be p type and the devices operate in accumulation only. The hole mobility in devices thermally annealed under vacuum is around 10 -3 cm 2 V -1 s -1. On exposure to ambient laboratory air, the device conductance increases by several orders of magnitude. This increase may be reversed by subjecting the device to a further high-temperature anneal under vacuum. Subsidiary experiments show that these effects are caused by the reversible doping of the polymer by gaseous oxygen.
dc.identifier.doihttps://dx.doi.org/10.1088/0022-3727/24/11/019
dc.identifier.issn0022-3727
dc.identifier.otherAUT: HGO00803;
dc.identifier.urihttp://hdl.handle.net/10400.1/6624
dc.language.isoeng
dc.peerreviewedyes
dc.publisherIOP Publishing
dc.relation.isbasedonP-008-W1F
dc.titleEffect of oxygen on the electrical characteristics of field effect transistors formed from electrochemically deposited films of poly(3-methylthiophene)
dc.typejournal article
dspace.entity.typePublication
oaire.citation.endPage2038
oaire.citation.startPage2032
oaire.citation.titleJournal of Physics D: Applied Physics
oaire.citation.volume24
person.familyNameGomes
person.givenNameHenrique Leonel
person.identifier.orcid0000-0003-3664-4740
person.identifier.scopus-author-id7005305880
rcaap.rightsrestrictedAccess
rcaap.typearticle
relation.isAuthorOfPublication6da677b9-927f-423d-8657-448a0dccb67c
relation.isAuthorOfPublication.latestForDiscovery6da677b9-927f-423d-8657-448a0dccb67c

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