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Current–voltage characteristics of a Co/Ni bilayer nanofilm

2023-01Journal article Restricted access
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dc.contributor.authorKhmelinskii, Igor
dc.contributor.authorMakarov, Vladimir
dc.date.accessioned2023-01-25T16:21:24Z
dc.date.available2023-01-25T16:21:24Z
dc.date.issued2023-01
dc.description.abstractWidespread interest in optical and electrical properties of nanostructured systems began more than 20 years ago. Here, optical and electrical properties of Co/Ni bilayer nanofilms are explored. These optical and electrical properties were described in terms of a common confined wavefunction spanning both Co and Ni layers. The effective relative electron mass parameter f estimated for this bilayer film was about 0.1489. Temperature dependence of the current-voltage characteristics of the Co/Ni bilayer nanofilms was described as that of a Schottky diode with the Schottky barrier height of US = 24 cm-1, very small compared to other semiconducting materials. Therefore, Co/Ni bilayer nanofilms apparently had semiconducting properties, which may approxi-mately be described using Schottky diode theory. Such semiconducting properties of bilayer metal nanofilms could be used in special low-temperature low-consumption electronic devices.pt_PT
dc.description.versioninfo:eu-repo/semantics/publishedVersionpt_PT
dc.identifier.doi10.1016/j.jpcs.2022.111049pt_PT
dc.identifier.eissn1879-2553
dc.identifier.urihttp://hdl.handle.net/10400.1/18931
dc.language.isoengpt_PT
dc.peerreviewedyespt_PT
dc.publisherPergamon - Elsevierpt_PT
dc.subjectCo/ Ni bilayer nanofilmpt_PT
dc.subjectCurrent -voltage characteristicspt_PT
dc.subjectSemiconductorpt_PT
dc.subjectMetal thin filmpt_PT
dc.titleCurrent–voltage characteristics of a Co/Ni bilayer nanofilmpt_PT
dc.typejournal article
dspace.entity.typePublication
oaire.citation.startPage111049pt_PT
oaire.citation.titleJournal of Physics and Chemistry of Solidspt_PT
oaire.citation.volume172pt_PT
person.familyNameKhmelinskii
person.givenNameIgor
person.identifier0000000420541031
person.identifier.ciencia-id0D1A-CB6C-6316
person.identifier.orcid0000-0002-6116-184X
person.identifier.ridC-9587-2011
person.identifier.scopus-author-id6701444934
rcaap.rightsrestrictedAccesspt_PT
rcaap.typearticlept_PT
relation.isAuthorOfPublicationfcb9f09f-2e99-41fb-8c08-7e1acbc65076
relation.isAuthorOfPublication.latestForDiscoveryfcb9f09f-2e99-41fb-8c08-7e1acbc65076

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