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Analysis of deep levels in a phenylenevinylene polymer by transient capacitance methods

dc.contributor.authorGomes, Henrique L.
dc.contributor.authorStallinga, Peter
dc.contributor.authorRost, H.
dc.contributor.authorHolmes, A. B.
dc.contributor.authorHarrison, M. G.
dc.contributor.authorFriend, R. H.
dc.date.accessioned2015-06-26T14:18:46Z
dc.date.available2015-06-26T14:18:46Z
dc.date.issued1999
dc.description.abstractTransient capacitance methods were applied to the depletion region of an abrupt asymmetric n(+) -p junction of silicon and unintentionally doped poly[2-methoxy, 5 ethyl (2' hexyloxy) paraphenylenevinylene] (MEH-PPV). Studies in the temperature range 100-300 K show the presence of a majority-carrier trap at 1.0 eV and two minority traps at 0.7 and 1.3 eV, respectively. There is an indication for more levels for which the activation energy could not be determined. Furthermore, admittance data reveal a bulk activation energy for conduction of 0.12 eV, suggesting the presence of an additional shallow acceptor state. (C) 1999 American Institute of Physics. [S0003-6951(99)02308-6].
dc.identifier.doihttps://dx.doi.org/10.1063/1.123469
dc.identifier.issn0003-6951
dc.identifier.otherAUT: PJO01566; HGO00803;
dc.identifier.urihttp://hdl.handle.net/10400.1/6634
dc.language.isoeng
dc.peerreviewedyes
dc.publisherAmerican Institute of Physics
dc.relation.isbasedonP-001-537
dc.titleAnalysis of deep levels in a phenylenevinylene polymer by transient capacitance methods
dc.typejournal article
dspace.entity.typePublication
oaire.citation.endPage1146
oaire.citation.startPage1144
oaire.citation.titleApplied Physics Letters
oaire.citation.volume74
person.familyNameGomes
person.familyNameStallinga
person.givenNameHenrique Leonel
person.givenNamePeter
person.identifier2477494
person.identifier.ciencia-idC917-2333-5797
person.identifier.orcid0000-0003-3664-4740
person.identifier.orcid0000-0002-9581-6875
person.identifier.scopus-author-id7005305880
person.identifier.scopus-author-id6701332987
rcaap.rightsopenAccess
rcaap.typearticle
relation.isAuthorOfPublication6da677b9-927f-423d-8657-448a0dccb67c
relation.isAuthorOfPublicationa81fc5fb-94ec-4160-bfdc-ea33cfdbf216
relation.isAuthorOfPublication.latestForDiscovery6da677b9-927f-423d-8657-448a0dccb67c

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