Silicon strip detectors for two-dimensional soft X-ray imaging at normal incidence

A simple prototype system for static two-dimensional soft X-ray imaging using silicon microstrip detectors irradiated at normal incidence is presented. Radiation sensors consist of single-sided silicon detectors made from 300 mum thick wafers, read by RX64 ASICs. Data acquisition and control is performed by a Windows PC workstation running dedicated LabVIEW routines, connected to the sensors through a PCI-DIO-96 interface. Two-dimensional images are obtained by scanning a lead collimator with a thin slit perpendicular to the strip axis, along the whole detector size; the several strip profiles (slices) taken at each position are then put together to form a planar image. Preliminary results are presented, illustrating the high-resolution imaging capabilities of the system with soft X-rays. (C) 2003 Elsevier B.V. All rights reserved.

URI

http://hdl.handle.net/10400.1/11189

Editora

Elsevier Science Bv

DOI

10.1016/S0168-9002(03)01646-2

Coleções

FCB2-Artigos (em revistas ou actas indexadas)

Licença CC

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