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Determination of deep and shallow levels in conjugated polymers by electrical methods

1999Journal article Restricted access
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dc.contributor.authorStallinga, Peter
dc.contributor.authorGomes, Henrique L.
dc.contributor.authorRost, H.
dc.contributor.authorHolmes, A. B.
dc.contributor.authorHarrison, M. G.
dc.contributor.authorFriend, R. H.
dc.contributor.authorBiscarini, F.
dc.contributor.authorTaliani, C.
dc.contributor.authorJones, G. W.
dc.contributor.authorTaylor, D. M.
dc.date.accessioned2015-06-26T14:18:43Z
dc.date.available2015-06-26T14:18:43Z
dc.date.issued1999
dc.description.abstractConjugated organic semiconductors have been submitted to various electrical measurement techniques in order to reveal information about shallow levels and deep traps in the forbidden gap. The materials consisted of poly[2-methoxy, 5 ethyl (2' hexyloxy) paraphenylenevinylene] (MEH-PPV), poly(3-methylthiophene) (PMeT), and alpha-sexithienyl (alpha T6) and the employed techniques were IV, CV, admittance spectroscopy, TSC, capacitance and current transients. (C) 1999 Elsevier Science B.V. All rights reserved.
dc.identifier.doihttps://dx.doi.org/10.1016/S0921-4526(99)00555-4
dc.identifier.issn0921-4526
dc.identifier.otherAUT: PJO01566; HGO00803;
dc.identifier.urihttp://hdl.handle.net/10400.1/6612
dc.language.isoeng
dc.peerreviewedyes
dc.publisherElsevier science
dc.relation.isbasedonP-001-2RT
dc.titleDetermination of deep and shallow levels in conjugated polymers by electrical methods
dc.typejournal article
dspace.entity.typePublication
oaire.citation.conferencePlaceBerkeley
oaire.citation.endPage926
oaire.citation.startPage923
oaire.citation.titlePhysica B: Condensed Matter
oaire.citation.title20th International Conference on Defects in Semiconductors (ICDS-20)
oaire.citation.volume273-274
person.familyNameStallinga
person.familyNameGomes
person.givenNamePeter
person.givenNameHenrique Leonel
person.identifier2477494
person.identifier.ciencia-idC917-2333-5797
person.identifier.orcid0000-0002-9581-6875
person.identifier.orcid0000-0003-3664-4740
person.identifier.scopus-author-id6701332987
person.identifier.scopus-author-id7005305880
rcaap.rightsrestrictedAccess
rcaap.typearticle
relation.isAuthorOfPublicationa81fc5fb-94ec-4160-bfdc-ea33cfdbf216
relation.isAuthorOfPublication6da677b9-927f-423d-8657-448a0dccb67c
relation.isAuthorOfPublication.latestForDiscoverya81fc5fb-94ec-4160-bfdc-ea33cfdbf216

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