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Inkjet-printed organic electronics: Operational stability and reliability issues

2013Conference object Restricted access
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dc.contributor.authorMedeiros, M. C. R.
dc.contributor.authorMartinez Domingo, C.
dc.contributor.authorRamon, E.
dc.contributor.authorNegrier, A. T.
dc.contributor.authorSowade, E.
dc.contributor.authorMitra, K. Y.
dc.contributor.authorBaumann, R. R.
dc.contributor.authorMcCulloch, I.
dc.contributor.authorCarrabina, J.
dc.contributor.authorGomes, Henrique L.
dc.date.accessioned2015-06-26T14:18:46Z
dc.date.available2015-06-26T14:18:46Z
dc.date.issued2013
dc.description.abstractThe operational stability of all-inkjet printed transistors is reported. At room temperature the threshold voltage shifts following a stretched exponential with a relaxation time τ=1×103 s. Two distinct trap sites active in different temperature ranges, one at 200-250 K and other above 310 K cause the electrical instability. Both types of traps capture holes and can be fast neutralized by photogenerated electrons. Optically induced detrapping currents confirm the differences in trap signature. It is proposed, that the traps have a common physical origin related to water. © The Electrochemical Society.
dc.identifier.doihttps://dx.doi.org/10.1149/05326.0001ecst
dc.identifier.isbn9781607684787
dc.identifier.issn1938-5862
dc.identifier.otherAUT: HGO00803;
dc.identifier.urihttp://hdl.handle.net/10400.1/6628
dc.language.isoeng
dc.peerreviewedyes
dc.publisherElectrochemical Society Inc.
dc.relation.isbasedonP-009-S7T
dc.titleInkjet-printed organic electronics: Operational stability and reliability issues
dc.typeconference object
dspace.entity.typePublication
oaire.citation.conferencePlaceToronto
oaire.citation.endPage10
oaire.citation.issue26
oaire.citation.startPage1
oaire.citation.titleECS Transactions
oaire.citation.titleSymposium on Organic Semiconductor Materials, Devices, and Processing 4 - 223rd Meeting of the Electrochemical Society
oaire.citation.volume53
person.familyNameGomes
person.givenNameHenrique Leonel
person.identifier.orcid0000-0003-3664-4740
person.identifier.scopus-author-id7005305880
rcaap.rightsrestrictedAccess
rcaap.typeconferenceObject
relation.isAuthorOfPublication6da677b9-927f-423d-8657-448a0dccb67c
relation.isAuthorOfPublication.latestForDiscovery6da677b9-927f-423d-8657-448a0dccb67c

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