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Influence of fabrication conditions on the electrical behaviour of polymer Schottky diodes

dc.contributor.authorGomes, Henrique L.
dc.contributor.authorJones, G. W.
dc.contributor.authorTaylor, D. M.
dc.date.accessioned2015-06-26T14:18:41Z
dc.date.available2015-06-26T14:18:41Z
dc.date.issued1997
dc.description.abstractEvidence is presented which shows that anomalies in the I-V characteristics of Schottky diodes formed from electrodeposited poly(3-methylthiophene) are related to the time films are held under vacuum prior to deposition of the rectifying aluminium electrode. For short times (similar to 15 mins) a plateau appears in the forward bias characteristic which disappears leading to a significant voltage offset as the device ages or is driven into high forward bias.
dc.identifier.doihttps://dx.doi.org/10.1016/S0379-6779(97)80267-6
dc.identifier.issn0379-6779
dc.identifier.otherAUT: HGO00803;
dc.identifier.urihttp://hdl.handle.net/10400.1/6596
dc.language.isoeng
dc.peerreviewedyes
dc.publisherElsevier
dc.relation.isbasedonP-001-BZ8
dc.titleInfluence of fabrication conditions on the electrical behaviour of polymer Schottky diodes
dc.typejournal article
dspace.entity.typePublication
oaire.citation.conferencePlaceSnowbird
oaire.citation.endPage1352
oaire.citation.issue1-3
oaire.citation.startPage1351
oaire.citation.titleSynthetic Metals
oaire.citation.titleInternational Conference on the Science and Technology of Synthetic Metals
oaire.citation.volume85
person.familyNameGomes
person.givenNameHenrique Leonel
person.identifier.orcid0000-0003-3664-4740
person.identifier.scopus-author-id7005305880
rcaap.rightsrestrictedAccess
rcaap.typearticle
relation.isAuthorOfPublication6da677b9-927f-423d-8657-448a0dccb67c
relation.isAuthorOfPublication.latestForDiscovery6da677b9-927f-423d-8657-448a0dccb67c

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