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Electrical characterization of organic based transistors: stability issues
| dc.contributor.author | Gomes, Henrique L. | |
| dc.contributor.author | Stallinga, Peter | |
| dc.contributor.author | Dinelli, F. | |
| dc.contributor.author | Murgia, M. | |
| dc.contributor.author | Biscarini, F. | |
| dc.contributor.author | De Leeuw, D. M. | |
| dc.contributor.author | Muccini, M. | |
| dc.contributor.author | Mullen, K. | |
| dc.date.accessioned | 2015-06-26T14:18:44Z | |
| dc.date.available | 2015-06-26T14:18:44Z | |
| dc.date.issued | 2005 | |
| dc.description.abstract | An investigation into the stability of metal insulator semiconductor (MIS) transistors based on alpha-sexithiophene is reported. In particular the kinetics of the threshold voltage shift upon application of a gate bias has been determined. The kinetics follow a stretched-hyperbola type behavior, in agreement with the formalism developed to explain metastability in amorphous-silicon thin film transistors. Using this model, quantification of device stability is possible. Temperature-dependent measurements show that there are two processes involved in the threshold voltage shift, one occurring at T approximate to 220 K and the other at T approximate to 300 K. The latter process is found to be sample dependent. This suggests a relation between device stability and alpha-sexithiophene deposition parameters. Copyright (c) 2005 John Wiley A Sons, Ltd. | |
| dc.identifier.doi | https://dx.doi.org/10.1002/pat.558 | |
| dc.identifier.issn | 1042-7147 | |
| dc.identifier.other | AUT: PJO01566; HGO00803; | |
| dc.identifier.uri | http://hdl.handle.net/10400.1/6620 | |
| dc.language.iso | eng | |
| dc.publisher | John Wiley and Sons | |
| dc.relation.isbasedon | P-000-4YX | |
| dc.title | Electrical characterization of organic based transistors: stability issues | |
| dc.type | journal article | |
| dspace.entity.type | Publication | |
| oaire.citation.conferencePlace | Ft Lauderdale, FL | |
| oaire.citation.endPage | 231 | |
| oaire.citation.issue | 2-3 | |
| oaire.citation.startPage | 227 | |
| oaire.citation.title | Polymers for Advanced Technologies | |
| oaire.citation.title | 7th International Symposium on Polymers for Advanced Technologies | |
| oaire.citation.volume | 16 | |
| person.familyName | Gomes | |
| person.familyName | Stallinga | |
| person.givenName | Henrique Leonel | |
| person.givenName | Peter | |
| person.identifier | 2477494 | |
| person.identifier.ciencia-id | C917-2333-5797 | |
| person.identifier.orcid | 0000-0003-3664-4740 | |
| person.identifier.orcid | 0000-0002-9581-6875 | |
| person.identifier.scopus-author-id | 7005305880 | |
| person.identifier.scopus-author-id | 6701332987 | |
| rcaap.rights | restrictedAccess | |
| rcaap.type | article | |
| relation.isAuthorOfPublication | 6da677b9-927f-423d-8657-448a0dccb67c | |
| relation.isAuthorOfPublication | a81fc5fb-94ec-4160-bfdc-ea33cfdbf216 | |
| relation.isAuthorOfPublication.latestForDiscovery | 6da677b9-927f-423d-8657-448a0dccb67c |
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