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Thin-film field-effect transistors: The effects of traps on the bias and temperature dependence of field-effect mobility, including the Meyer-Neldel rule

dc.contributor.authorStallinga, Peter
dc.contributor.authorGomes, Henrique L.
dc.date.accessioned2015-06-26T14:18:42Z
dc.date.available2015-06-26T14:18:42Z
dc.date.issued2006
dc.description.abstractBased on the model of thin-film transistors in which the active layer is treated as two-dimensional, the effects of traps are studied. It is shown that when abundant discrete trap states are present, the field-effect mobility becomes temperature dependent. In case the traps are distributed exponentially in energy, a Meyer-Neldel rule for the temperature dependence of mobility and current results. When also the mobile states are distributed in energy, in the so-called band-tail states, the mobility is no longer thermally activated. (c) 2006 Elsevier B.V. All rights reserved.
dc.identifier.doihttps://dx.doi.org/10.1016/j.orgel.2006.10.003
dc.identifier.issn1566-1199
dc.identifier.otherAUT: PJO01566; HGO00803;
dc.identifier.urihttp://hdl.handle.net/10400.1/6600
dc.language.isoeng
dc.peerreviewedyes
dc.publisherElsevier
dc.relation.isbasedonP-004-FXJ
dc.titleThin-film field-effect transistors: The effects of traps on the bias and temperature dependence of field-effect mobility, including the Meyer-Neldel rule
dc.typejournal article
dspace.entity.typePublication
oaire.citation.endPage599
oaire.citation.issue6
oaire.citation.startPage592
oaire.citation.titleOrganic Electronics
oaire.citation.volume7
person.familyNameStallinga
person.familyNameGomes
person.givenNamePeter
person.givenNameHenrique Leonel
person.identifier2477494
person.identifier.ciencia-idC917-2333-5797
person.identifier.orcid0000-0002-9581-6875
person.identifier.orcid0000-0003-3664-4740
person.identifier.scopus-author-id6701332987
person.identifier.scopus-author-id7005305880
rcaap.rightsrestrictedAccess
rcaap.typearticle
relation.isAuthorOfPublicationa81fc5fb-94ec-4160-bfdc-ea33cfdbf216
relation.isAuthorOfPublication6da677b9-927f-423d-8657-448a0dccb67c
relation.isAuthorOfPublication.latestForDiscovery6da677b9-927f-423d-8657-448a0dccb67c

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