Repository logo
 
Publication

Low-frequency noise as a diagnostic tool for OLED reliability

2013Conference object Restricted access
Simple item page
dc.contributor.authorRocha, Paulo R. F.
dc.contributor.authorVandamme, L. K. J.
dc.contributor.authorMeskers, S. C. J.
dc.contributor.authorGomes, Henrique L.
dc.contributor.authorDe Leeuw, D. M.
dc.contributor.authorVan De Weijer, P.
dc.date.accessioned2015-06-26T14:18:43Z
dc.date.available2015-06-26T14:18:43Z
dc.date.issued2013
dc.description.abstractOrganic light emitting diodes (OLED), either based on polymers or small molecules, suffer from early failure: an unpredictable sudden increase in current with a total loss of light output. This work addresses this problem using small-signal impedance measurements and electrical noise techniques. Robust OLEDs show a current noise spectrum proportional to 1/f. OLEDs susceptible to failure have 1/f3/2 and/or may start exhibiting a standard 1/f behavior that rapidly evolves with time (typical 30 minutes) to 1/f1.6. In addition OLEDs susceptible to early failure have a higher DC leakage. It is proposed that a combination of both measurements can be used as a diagnostic tool for OLED reliability in a production line. Insight into the physics of the degradation mechanism is also provided. Unreliable OLEDs exhibit current switching events and optical blinks at wavelengths higher than the polymer band gap electroluminescence. It is proposed that degradation is induced by the appearance of an insulating resistive switching layer. Charge recombination trough this layer is responsible for the optical and electrical blinks. © 2013 IEEE.
dc.identifier.doihttps://dx.doi.org/10.1109/ICNF.2013.6578947
dc.identifier.isbn9781479906680
dc.identifier.otherAUT: HGO00803;
dc.identifier.urihttp://hdl.handle.net/10400.1/6607
dc.language.isoeng
dc.peerreviewedyes
dc.publisherIEEE
dc.relation.isbasedonP-008-DX5
dc.titleLow-frequency noise as a diagnostic tool for OLED reliability
dc.typeconference object
dspace.entity.typePublication
oaire.citation.conferencePlaceMontpellier
oaire.citation.endPage4
oaire.citation.startPage1
oaire.citation.title22nd International Conference on Noise and Fluctuations, ICNF 2013
person.familyNameRocha
person.familyNameGomes
person.givenNamePaulo
person.givenNameHenrique Leonel
person.identifier534265
person.identifier.ciencia-id2810-CAC1-6CA3
person.identifier.orcid0000-0002-8917-9101
person.identifier.orcid0000-0003-3664-4740
person.identifier.ridL-1223-2015
person.identifier.scopus-author-id36773579600
person.identifier.scopus-author-id7005305880
rcaap.rightsrestrictedAccess
rcaap.typeconferenceObject
relation.isAuthorOfPublicatione7993271-11b1-4028-ac2e-88d631d67381
relation.isAuthorOfPublication6da677b9-927f-423d-8657-448a0dccb67c
relation.isAuthorOfPublication.latestForDiscovery6da677b9-927f-423d-8657-448a0dccb67c

Files

Original bundle
Now showing 1 - 1 of 1
No Thumbnail Available
Name:
Low-frequency noise as a diagnostic tool for OLED reliability.pdf
Size:
379.39 KB
Format:
Adobe Portable Document Format
Download

Collections

FCT2-Artigos (em revistas ou actas indexadas)