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Spatially-resolved photocapacitance measurements to study defects in a-Si:H based p-i-n particle detectors

2008Journal article Restricted access
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dc.contributor.authorCasteleiro, C.
dc.contributor.authorSchwarz, R.
dc.contributor.authorMardolcar, U.
dc.contributor.authorMaçarico, A.
dc.contributor.authorMartins, J.
dc.contributor.authorVieira, M.
dc.contributor.authorWuensch, F.
dc.contributor.authorKunst, M.
dc.contributor.authorMorgado, E.
dc.contributor.authorStallinga, Peter
dc.contributor.authorGomes, Henrique L.
dc.date.accessioned2014-01-08T10:47:37Z
dc.date.available2014-01-08T10:47:37Z
dc.date.issued2008
dc.date.updated2014-01-02T21:33:07Z
dc.description.abstractThick large-area particle or X-ray detectors suffer degradation during operation due to creation of defects that act as deep traps. Measuring the photocurrent under homogeneously absorbed weak light can monitor variation in detector performance. We describe how photocapacitance can be used as an alternative method to measure the creation of defects and their energy level after intense irradiation with protons or He ions at 1.5 MeV and after exposure to intense laser pulses. The possibility to detect small areas of high defect density in a large-area detector structure is discussed.por
dc.identifier.citationCasteleiro, C.; Schwarz, R.; Mardolcar, U.; Maçarico, A.; Martins, J.; Vieira, M.; Wuensch, F.; Kunst, M.; Morgado, E.; Stallinga, P.; Gomes, H. L. Spatially-resolved photocapacitance measurements to study defects in a-Si:H based p-i-n particle detectors, Thin Solid Films, 516, 15, 5118-5121, 2008.por
dc.identifier.doihppt://dx.doi.org/10.1016/j.tsf.2008.01.012
dc.identifier.issn0040-6090
dc.identifier.otherAUT: PJO01566; HGO00803;
dc.identifier.urihttp://hdl.handle.net/10400.1/3302
dc.language.isoengpor
dc.peerreviewedyespor
dc.publisherElsevierpor
dc.subjectAmorphous silicon detectorpor
dc.subjectPhotocapacitancepor
dc.subjectRadiation resistancepor
dc.titleSpatially-resolved photocapacitance measurements to study defects in a-Si:H based p-i-n particle detectorspor
dc.typejournal article
dspace.entity.typePublication
oaire.citation.endPage5121por
oaire.citation.issue15por
oaire.citation.startPage5118por
oaire.citation.titleThin Solid Filmspor
oaire.citation.volume516por
person.familyNameStallinga
person.familyNameGomes
person.givenNamePeter
person.givenNameHenrique Leonel
person.identifier2477494
person.identifier.ciencia-idC917-2333-5797
person.identifier.orcid0000-0002-9581-6875
person.identifier.orcid0000-0003-3664-4740
person.identifier.scopus-author-id6701332987
person.identifier.scopus-author-id7005305880
rcaap.rightsrestrictedAccesspor
rcaap.typearticlepor
relation.isAuthorOfPublicationa81fc5fb-94ec-4160-bfdc-ea33cfdbf216
relation.isAuthorOfPublication6da677b9-927f-423d-8657-448a0dccb67c
relation.isAuthorOfPublication.latestForDiscoverya81fc5fb-94ec-4160-bfdc-ea33cfdbf216

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