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Organic materials for active layers in transistors: Study of the electrical stability properties

dc.contributor.authorGomes, Henrique L.
dc.contributor.authorStallinga, Peter
dc.contributor.authorDe Leeuw, D. M.
dc.date.accessioned2015-06-26T14:18:44Z
dc.date.available2015-06-26T14:18:44Z
dc.date.issued2006
dc.description.abstractField effect transistors based on several conjugated organic materials were fabricated and assesed in terms of electrical stability. The device characteristics were studied using steady state measurements as well as techniques for addressing trap states. Temperature-dependent measurements show clear evidence for an electrical instability occurring above 200 K that is caused by an electronic trapping process. It is suggested that the trapping sites are created by a change in the organic conjugated chain, a process similar to a phase transition.
dc.identifier.doihttps://dx.doi.org/ 10.4028/www.scientific.net/MSF.514-516.33
dc.identifier.isbn9780878494026
dc.identifier.issn0255-5476
dc.identifier.otherAUT: PJO01566; HGO00803;
dc.identifier.urihttp://hdl.handle.net/10400.1/6618
dc.language.isoeng
dc.peerreviewedyes
dc.publisherTrans Tech Publications
dc.relation.isbasedonP-004-NT7
dc.relation.ispartofMaterials Science Forum
dc.titleOrganic materials for active layers in transistors: Study of the electrical stability properties
dc.typejournal article
dspace.entity.typePublication
oaire.citation.conferencePlaceAveiro, Portugal
oaire.citation.endPage37
oaire.citation.startPage33
oaire.citation.titleAdvanced Materials Forum III
oaire.citation.title3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM)
oaire.citation.volume514-516
person.familyNameGomes
person.familyNameStallinga
person.givenNameHenrique Leonel
person.givenNamePeter
person.identifier2477494
person.identifier.ciencia-idC917-2333-5797
person.identifier.orcid0000-0003-3664-4740
person.identifier.orcid0000-0002-9581-6875
person.identifier.scopus-author-id7005305880
person.identifier.scopus-author-id6701332987
rcaap.rightsrestrictedAccess
rcaap.typearticle
relation.isAuthorOfPublication6da677b9-927f-423d-8657-448a0dccb67c
relation.isAuthorOfPublicationa81fc5fb-94ec-4160-bfdc-ea33cfdbf216
relation.isAuthorOfPublication.latestForDiscovery6da677b9-927f-423d-8657-448a0dccb67c

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