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Study of trap states in zinc oxide (ZnO) thin films for electronic applications

2008Journal article Open access
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dc.contributor.authorCasteleiro, C.
dc.contributor.authorGomes, Henrique L.
dc.contributor.authorStallinga, Peter
dc.contributor.authorBentes, L.
dc.contributor.authorAyouchi, R.
dc.contributor.authorSchwarz, R.
dc.date.accessioned2014-01-08T09:56:45Z
dc.date.available2014-01-08T09:56:45Z
dc.date.issued2008
dc.date.updated2014-01-02T21:36:11Z
dc.description.abstractThe electrical properties of ZnO thin films grown by pulsed laser deposition were studied. Field-effect devices with a mobility reaching 1 cm2/V s show non-linearities both in the current–voltage and in the transfer characteristics which are explained as due to the presence of trap states. These traps cause a reversible threshold voltage shift as revealed by low-frequency capacitance–voltage measurements in metal insulator semiconductor (MIS) capacitors. Thermal detrapping experiments in heterojunctions confirm the presence of a trap state located at 0.32 eV.por
dc.identifier.citationCasteleiro, C.; Gomes, H. L.; Stallinga, P.; Bentes, L.; Ayouchi, R.; Schwarz, R. Study of trap states in zinc oxide (ZnO) thin films for electronic applications, Journal of Non-Crystalline Solids, 354, 19-25, 2519-2522, 2008.por
dc.identifier.doihttp://dx.doi.org/10.1016/j.jnoncrysol.2007.10.059
dc.identifier.issn0022-3093
dc.identifier.otherAUT: HGO00803; PJO01566;
dc.identifier.urihttp://hdl.handle.net/10400.1/3298
dc.language.isoengpor
dc.peerreviewedyespor
dc.publisherElsevierpor
dc.subjectThin film transistorspor
dc.subjectThermally stimulated and depolarization currentpor
dc.subjectLaser depositionpor
dc.subjectDefectspor
dc.titleStudy of trap states in zinc oxide (ZnO) thin films for electronic applicationspor
dc.typejournal article
dspace.entity.typePublication
oaire.citation.endPage2522por
oaire.citation.issue19-25por
oaire.citation.startPage2519por
oaire.citation.titleJournal of Non-Crystalline Solidspor
oaire.citation.volume354por
person.familyNameGomes
person.familyNameStallinga
person.familyNameBentes
person.givenNameHenrique Leonel
person.givenNamePeter
person.givenNameLuis
person.identifier2477494
person.identifier.ciencia-idC917-2333-5797
person.identifier.ciencia-idC619-63A6-6076
person.identifier.orcid0000-0003-3664-4740
person.identifier.orcid0000-0002-9581-6875
person.identifier.orcid0000-0001-6884-2886
person.identifier.ridD-5057-2009
person.identifier.scopus-author-id7005305880
person.identifier.scopus-author-id6701332987
person.identifier.scopus-author-id6603195176
rcaap.rightsopenAccesspor
rcaap.typearticlepor
relation.isAuthorOfPublication6da677b9-927f-423d-8657-448a0dccb67c
relation.isAuthorOfPublicationa81fc5fb-94ec-4160-bfdc-ea33cfdbf216
relation.isAuthorOfPublication6569b202-4643-45ec-9861-9fd8d5f09601
relation.isAuthorOfPublication.latestForDiscovery6da677b9-927f-423d-8657-448a0dccb67c

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