Interface state mapping in a Schottky barrier of the organic semiconductor terrylene

Stallinga, Peter; Gomes, Henrique L.; Murgia, M.; Mullen, K.

http://hdl.handle.net/10400.1/6640

Utilize este identificador para referenciar este registo.

Nome:	Descrição:	Tamanho:	Formato:
Interface state mapping in a Schottky barrier of the organic semiconductor terrylene.pdf		236.63 KB	Adobe PDF	Ver/Abrir

Contacte-nos

Autores

Resumo(s)

In this work we quantitatively map interface states in energy in a Schottky barrier between aluminum and the vacuum sublimed organic semiconductor terrylene. The density map of these interface states was extracted from the, admittance spectroscopy data. They revealed an interface state density of 2 x 10(12). cm(-2)eV(-1) close to the valence band which decreases slightly towards midgap. Additional do measurements show that the semiconductor bulk activation energy is 0.33 eV which may correspond to an acceptor level. (C) 2002 Elsevier Science B.V. All rights reserved.

URI

http://hdl.handle.net/10400.1/6640

Editora

Elsevier

DOI

https://dx.doi.org/10.1016/S1566-1199(02)00024-1

Coleções

FCT2-Artigos (em revistas ou actas indexadas)

Métricas Alternativas

Ver registo completo