Utilize este identificador para referenciar este registo: http://hdl.handle.net/10400.1/6612
Título: Determination of deep and shallow levels in conjugated polymers by electrical methods
Autor: Stallinga, Peter
Gomes, Henrique L.
Rost, H.
Holmes, A. B.
Harrison, M. G.
Friend, R. H.
Biscarini, F.
Taliani, C.
Jones, G. W.
Taylor, D. M.
Data: 1999
Editora: Elsevier science
Resumo: Conjugated organic semiconductors have been submitted to various electrical measurement techniques in order to reveal information about shallow levels and deep traps in the forbidden gap. The materials consisted of poly[2-methoxy, 5 ethyl (2' hexyloxy) paraphenylenevinylene] (MEH-PPV), poly(3-methylthiophene) (PMeT), and alpha-sexithienyl (alpha T6) and the employed techniques were IV, CV, admittance spectroscopy, TSC, capacitance and current transients. (C) 1999 Elsevier Science B.V. All rights reserved.
Peer review: yes
URI: http://hdl.handle.net/10400.1/6612
DOI: https://dx.doi.org/10.1016/S0921-4526(99)00555-4
ISSN: 0921-4526
Aparece nas colecções:FCT2-Artigos (em revistas ou actas indexadas)

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