Electrical characterization of semiconducting polymers

Stallinga, Peter; Gomes, Henrique L.; Jones, G. W.; Taylor, D. M.

http://hdl.handle.net/10400.1/6638

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Abstract(s)

Schottky diodes resulting from an intimate contact of aluminum on electrodeposited poly(3-methylthiopene) were studied by admittance spectroscopy, capacitance-voltage measurements and voltaic and optically-induced current and capacitance transients. The loss tangents show the existence of interface states that can be removed by vacuum annealing. Furthermore, the C-V curves contradict the idea of movement of the dopant ions.