Browsing by Author "Colle, M."
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- Dynamics of threshold voltage shifts in organic and amorphous silicon field-effect transistorsPublication . Mathijssen, S. G. J.; Colle, M.; Gomes, Henrique L.; Smits, E. C. P.; de Boer, B.; McCulloch, I.; Bobbert, P. A.; de Leeuw, D. M.The electrical instability of organic field-effect transistors is investigated. We observe that the threshold-voltage shift (see figure) shows a stretched-exponential time dependence under an applied gate bias. The activation energy of 0.6 eV is common for our and all other organic transistors reported so far. The constant activation energy supports charge trapping by residual water as the common origin.
- Electrical instabilities in organic semiconductors caused by trapped supercooled waterPublication . Gomes, Henrique L.; Stallinga, Peter; Colle, M.; De Leeuw, D. M.; Biscarini, F.It is reported that the electrical instability known as bias stress is caused by the presence of trapped water in the organic layer. Experimental evidence as provided by the observation of an anomaly occurring systematically at around 200 K. This anomaly is observed in a variety of materials, independent of the deposition techniques and remarkably coincides with a known phase transition of supercooled water. Confined water does not crystallize at 273 K but forms a metastable liquid. This metastable water behaves electrically as a charge trap, which causes the instability. Below 200 K the water finally solidifies and the electrical traps disappear. (c) 2006 American Institute of Physics.
- The effect of water related traps on the reliability of organic based transistorsPublication . Gomes, Henrique L.; Stallinga, Peter; Colle, M.; Biscarini, F.; De Leeuw, D. M.The electrical stability of metal-insulator semiconductor (MIS) capacitors and field-effect transistor structures based in organic semiconductors were investigated. The device characteristics were studied using steady state measurements AC admittance measurements as well as techniques for addressing trap states. Temperature-dependent measurements show clear evidence that an electrical instability occurs above 200 K and is caused by an electronic trapping process. Experimental results show that water is responsible for the trapping mechanism. (c) 2006 Elsevier B.V. All rights reserved.