The effect of water related traps on the reliability of organic based transistors

Gomes, Henrique L.; Stallinga, Peter; Colle, M.; Biscarini, F.; De Leeuw, D. M.

http://hdl.handle.net/10400.1/6610

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Resumo(s)

The electrical stability of metal-insulator semiconductor (MIS) capacitors and field-effect transistor structures based in organic semiconductors were investigated. The device characteristics were studied using steady state measurements AC admittance measurements as well as techniques for addressing trap states. Temperature-dependent measurements show clear evidence that an electrical instability occurs above 200 K and is caused by an electronic trapping process. Experimental results show that water is responsible for the trapping mechanism. (c) 2006 Elsevier B.V. All rights reserved.

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http://hdl.handle.net/10400.1/6610

Editora

Elsevier

DOI

https://dx.doi.org/10.1016/j.jnoncrysol.2005.10.069

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FCT2-Artigos (em revistas ou actas indexadas)

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