Trap states as an explanation for the Meyer-Neldel rule in semiconductors

Stallinga, Peter; Gomes, Henrique L.

http://hdl.handle.net/10400.1/6615

Utilize este identificador para referenciar este registo.

Nome:	Descrição:	Tamanho:	Formato:
Trap states as an explanation for the Meyer–Neldel rule in semiconductors.pdf		129.82 KB	Adobe PDF	Ver/Abrir

Contacte-nos

Autores

Stallinga, Peter

Gomes, Henrique L.

Resumo(s)

It is shown that whenever traps, distributed exponentially in energy, are governing the conduction in electrical materials, a Meyer-Neldel observation is expected. This is a direct result of the model incorporating a high density of traps by Shur and Hack. Since this type of conduction is common for low mobility materials, such as organic semiconductors or amorphous silicon, they are therefore likely to obey the Meyer-Neldel rule. (C) 2005 Elsevier B.V. All rights reserved.

URI

http://hdl.handle.net/10400.1/6615

Editora

Elsevier

DOI

https://dx.doi.org/10.1016/j.orgel.2005.03.008

Coleções

FCT2-Artigos (em revistas ou actas indexadas)

Métricas Alternativas

Ver registo completo