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Trap states as an explanation for the Meyer-Neldel rule in semiconductors

dc.contributor.authorStallinga, Peter
dc.contributor.authorGomes, Henrique L.
dc.date.accessioned2015-06-26T14:18:44Z
dc.date.available2015-06-26T14:18:44Z
dc.date.issued2005
dc.description.abstractIt is shown that whenever traps, distributed exponentially in energy, are governing the conduction in electrical materials, a Meyer-Neldel observation is expected. This is a direct result of the model incorporating a high density of traps by Shur and Hack. Since this type of conduction is common for low mobility materials, such as organic semiconductors or amorphous silicon, they are therefore likely to obey the Meyer-Neldel rule. (C) 2005 Elsevier B.V. All rights reserved.
dc.identifier.doihttps://dx.doi.org/10.1016/j.orgel.2005.03.008
dc.identifier.issn1566-1199
dc.identifier.otherAUT: PJO01566; HGO00803;
dc.identifier.urihttp://hdl.handle.net/10400.1/6615
dc.language.isoeng
dc.peerreviewedyes
dc.publisherElsevier
dc.relation.isbasedonP-000-36P
dc.titleTrap states as an explanation for the Meyer-Neldel rule in semiconductors
dc.typejournal article
dspace.entity.typePublication
oaire.citation.endPage141
oaire.citation.issue3
oaire.citation.startPage137
oaire.citation.titleOrganic Electronics
oaire.citation.volume6
person.familyNameStallinga
person.familyNameGomes
person.givenNamePeter
person.givenNameHenrique Leonel
person.identifier2477494
person.identifier.ciencia-idC917-2333-5797
person.identifier.orcid0000-0002-9581-6875
person.identifier.orcid0000-0003-3664-4740
person.identifier.scopus-author-id6701332987
person.identifier.scopus-author-id7005305880
rcaap.rightsrestrictedAccess
rcaap.typearticle
relation.isAuthorOfPublicationa81fc5fb-94ec-4160-bfdc-ea33cfdbf216
relation.isAuthorOfPublication6da677b9-927f-423d-8657-448a0dccb67c
relation.isAuthorOfPublication.latestForDiscovery6da677b9-927f-423d-8657-448a0dccb67c

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