Publicação
The effect of water related traps on the reliability of organic based transistors
| dc.contributor.author | Gomes, Henrique L. | |
| dc.contributor.author | Stallinga, Peter | |
| dc.contributor.author | Colle, M. | |
| dc.contributor.author | Biscarini, F. | |
| dc.contributor.author | De Leeuw, D. M. | |
| dc.date.accessioned | 2015-06-26T14:18:43Z | |
| dc.date.available | 2015-06-26T14:18:43Z | |
| dc.date.issued | 2006 | |
| dc.description.abstract | The electrical stability of metal-insulator semiconductor (MIS) capacitors and field-effect transistor structures based in organic semiconductors were investigated. The device characteristics were studied using steady state measurements AC admittance measurements as well as techniques for addressing trap states. Temperature-dependent measurements show clear evidence that an electrical instability occurs above 200 K and is caused by an electronic trapping process. Experimental results show that water is responsible for the trapping mechanism. (c) 2006 Elsevier B.V. All rights reserved. | |
| dc.identifier.doi | https://dx.doi.org/10.1016/j.jnoncrysol.2005.10.069 | |
| dc.identifier.issn | 0022-3093 | |
| dc.identifier.other | AUT: PJO01566; HGO00803; | |
| dc.identifier.uri | http://hdl.handle.net/10400.1/6610 | |
| dc.language.iso | eng | |
| dc.peerreviewed | yes | |
| dc.publisher | Elsevier | |
| dc.relation.isbasedon | P-004-K6V | |
| dc.title | The effect of water related traps on the reliability of organic based transistors | |
| dc.type | journal article | |
| dspace.entity.type | Publication | |
| oaire.citation.conferencePlace | Lisbon, Portugal | |
| oaire.citation.endPage | 1764 | |
| oaire.citation.issue | 9-20 | |
| oaire.citation.startPage | 1761 | |
| oaire.citation.title | Journal of Non-Crystalline Solids | |
| oaire.citation.title | 21st International Conference on Amorphous and Nanocrystalline Semiconductors | |
| oaire.citation.volume | 352 | |
| person.familyName | Gomes | |
| person.familyName | Stallinga | |
| person.givenName | Henrique Leonel | |
| person.givenName | Peter | |
| person.identifier | 2477494 | |
| person.identifier.ciencia-id | C917-2333-5797 | |
| person.identifier.orcid | 0000-0003-3664-4740 | |
| person.identifier.orcid | 0000-0002-9581-6875 | |
| person.identifier.scopus-author-id | 7005305880 | |
| person.identifier.scopus-author-id | 6701332987 | |
| rcaap.rights | restrictedAccess | |
| rcaap.type | article | |
| relation.isAuthorOfPublication | 6da677b9-927f-423d-8657-448a0dccb67c | |
| relation.isAuthorOfPublication | a81fc5fb-94ec-4160-bfdc-ea33cfdbf216 | |
| relation.isAuthorOfPublication.latestForDiscovery | a81fc5fb-94ec-4160-bfdc-ea33cfdbf216 |
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