Publication
Electronic levels in MEH-PPV
| dc.contributor.author | Stallinga, Peter | |
| dc.contributor.author | Gomes, Henrique L. | |
| dc.contributor.author | Rost, H. | |
| dc.contributor.author | Holmes, A. B. | |
| dc.contributor.author | Harrison, M. G. | |
| dc.contributor.author | Friend, R. H. | |
| dc.date.accessioned | 2015-06-26T14:18:42Z | |
| dc.date.available | 2015-06-26T14:18:42Z | |
| dc.date.issued | 2000 | |
| dc.description.abstract | pn-Junctions of MEH-PPV on top of heavily doped n-type silicon were used in electrical measurements. Through deep-level transient-spectroscopy (DLTS)-like measurements, four traps (two majority and two minority traps) could be identified on top of the shallow acceptor level responsible for conduction. Furthermore, evidence is found for interface states. (C) 2000 Published by Elsevier Science S.A. All rights reserved. | |
| dc.identifier.doi | https://dx.doi.org/10.1016/S0379-6779(99)00413-0 | |
| dc.identifier.issn | 0379-6779 | |
| dc.identifier.other | AUT: PJO01566; HGO00803; | |
| dc.identifier.uri | http://hdl.handle.net/10400.1/6602 | |
| dc.language.iso | eng | |
| dc.peerreviewed | yes | |
| dc.publisher | Elsevier Science | |
| dc.relation.isbasedon | P-001-00H | |
| dc.title | Electronic levels in MEH-PPV | |
| dc.type | journal article | |
| dspace.entity.type | Publication | |
| oaire.citation.conferencePlace | Sheffield, England | |
| oaire.citation.endPage | 537 | |
| oaire.citation.startPage | 535 | |
| oaire.citation.title | Synthetic Metals | |
| oaire.citation.title | 2nd International Conference on Electroluminescene of Molecular Materials and Related Phenomena (ICEL-2) | |
| oaire.citation.volume | 111-112 | |
| person.familyName | Stallinga | |
| person.familyName | Gomes | |
| person.givenName | Peter | |
| person.givenName | Henrique Leonel | |
| person.identifier | 2477494 | |
| person.identifier.ciencia-id | C917-2333-5797 | |
| person.identifier.orcid | 0000-0002-9581-6875 | |
| person.identifier.orcid | 0000-0003-3664-4740 | |
| person.identifier.scopus-author-id | 6701332987 | |
| person.identifier.scopus-author-id | 7005305880 | |
| rcaap.rights | restrictedAccess | |
| rcaap.type | article | |
| relation.isAuthorOfPublication | a81fc5fb-94ec-4160-bfdc-ea33cfdbf216 | |
| relation.isAuthorOfPublication | 6da677b9-927f-423d-8657-448a0dccb67c | |
| relation.isAuthorOfPublication.latestForDiscovery | a81fc5fb-94ec-4160-bfdc-ea33cfdbf216 |
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