Repository logo
 
Publication

Electrical characterization of pn-junctions of PPV and silicon

dc.contributor.authorStallinga, Peter
dc.contributor.authorGomes, Henrique L.
dc.contributor.authorCharas, A.
dc.contributor.authorMorgado, J.
dc.contributor.authorAlcacer, L.
dc.date.accessioned2015-06-26T14:18:47Z
dc.date.available2015-06-26T14:18:47Z
dc.date.issued2001
dc.description.abstractPoly(phenylene vinylene) (PPV) grown via the precursor route, deposited on top of heavily doped n-type silicon, was studied using electrical measurement techniques. The results are compared to PPV grown via deposition of soluble derivative (MEH-PPV). The two types are very similar. They have comparable free carrier densities and both show minority-carrier effects. The activation energy found via the loss tangent is 0.13 eV. The effect of exposure to oxygen is visible in the capacitance and the current.
dc.identifier.doihttps://dx.doi.org/10.1016/S0379-6779(00)01174-7
dc.identifier.issn0379-6779
dc.identifier.otherAUT: PJO01566; HGO00803;
dc.identifier.urihttp://hdl.handle.net/10400.1/6644
dc.language.isoeng
dc.peerreviewedyes
dc.publisherElsevier
dc.relation.isbasedonP-000-W3X
dc.titleElectrical characterization of pn-junctions of PPV and silicon
dc.typejournal article
dspace.entity.typePublication
oaire.citation.conferencePlaceGastein, Austria
oaire.citation.endPage1536
oaire.citation.issue1-3
oaire.citation.startPage1535
oaire.citation.titleSynthetic Metals
oaire.citation.title16th International Conference on Science and Technology of Synthetic Metals (ICSM 2000)
oaire.citation.volume121
person.familyNameStallinga
person.familyNameGomes
person.givenNamePeter
person.givenNameHenrique Leonel
person.identifier2477494
person.identifier.ciencia-idC917-2333-5797
person.identifier.orcid0000-0002-9581-6875
person.identifier.orcid0000-0003-3664-4740
person.identifier.scopus-author-id6701332987
person.identifier.scopus-author-id7005305880
rcaap.rightsrestrictedAccess
rcaap.typearticle
relation.isAuthorOfPublicationa81fc5fb-94ec-4160-bfdc-ea33cfdbf216
relation.isAuthorOfPublication6da677b9-927f-423d-8657-448a0dccb67c
relation.isAuthorOfPublication.latestForDiscovery6da677b9-927f-423d-8657-448a0dccb67c

Files

Original bundle
Now showing 1 - 1 of 1
No Thumbnail Available
Name:
Electrical characterization of pn-junctions of PPV and silicon.pdf
Size:
236.13 KB
Format:
Adobe Portable Document Format