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- Electroforming process in metal-oxide-polymer resistive switching memoriesPublication . Chen, Q.; Gomes, Henrique L.; Kiazadeh, Asal; Rocha, Paulo R. F.; De Leeuw, Dago M.; Meskers, S. C. J.Electroforming of an Al/Al2O3/polymer/Al esistive switching diode is reported. Electroforming is a dielectric soft-breakdown mechanism leading to hysteretic current–voltage characteristics and non–volatile memory behavior. Electron trapping occurs at early stages of electroforming. Trapping is physically located at the oxide/polymer interface. The detrapping kinetics is faster under reverse bias and for thicker oxides layers. Thermally detrapping experiments give a trap depth of 0.65 eV and a density of 5x1017 /cm2. It is proposed that the trapped electrons induce a dipole layer across the oxide. The associated electric field triggers breakdown and ultimately dictate the overall memory characteristics.
- New electronic memory device concepts based on metal oxide-polymer nanostructures planer diodesPublication . Kiazadeh, Asal; Rocha, P. R. F.; Chen, Q.; Gomes, Henrique L.Nanostructure silver oxide thin films diodes can exhibit resistive switching effects. After an electroforming process the device can be programmed between a low conductance (off-state) and high conductance (on- state) with a voltage pulse and they are already being considered for non-volatile memory applications. However, the origin of programmable resistivity changes in a network of nanostructure silver oxide embedded in polymer is still a matter of debate. This work provides some results on a planer diode which may help to elucidate resistive switching phenomena in nanostructure metal oxide diodes. The XRD pattern after switching appears with different crystalline planes, plus temperature dependent studies reveal that conduction of both on and off states is weak thermal activated. Intriguing the carrier transport is the same for both on and off-states. Difference between states comes from the dramatic changes in the carrier density. The main mechanism of charge transport for on-state is tunneling. The charge transport leads to SCLC in higher voltages pulse for the off state. The mechanism will be explained based on percolation concepts.
- The role of internal structure in the anomalous switching dynamics of metal-oxide/polymer resistive random access memoriesPublication . Rocha, Paulo R. F.; Kiazadeh, Asal; De Leeuw, Dago M.; Meskers, S. C. J.; Verbakel, F.; Taylor, D. M.; Gomes, Henrique L.The dynamic response of a non-volatile, bistable resistive memory fabricated in the form of Al2O3/polymer diodes has been probed in both the off- and on-state using triangular and step voltage profiles. The results provide insight into the wide spread in switching times reported in the literature and explain an apparently anomalous behaviour of the on-state, namely the disappearance of the negative differential resistance region at high voltage scan rates which is commonly attributed to a “dead time” phenomenon. The off-state response follows closely the predictions based on a classical, two-layer capacitor description of the device. As voltage scan rates increase, the model predicts that the fraction of the applied voltage, Vox , appearing across the oxide decreases. Device responses to step voltages in both the off- and on-state show that switching events are characterized by a delay time. Coupling such delays to the lower values of Vox attained during fast scan rates, the anomalous observation in the on-state that, device currents decrease with increasing voltage scan rate, is readily explained. Assuming that a critical current is required to turn off a conducting channel in the oxide, a tentative model is suggested to explain the shift in the onset of negative differential resistance to lower voltages as the voltage scan rate increases. The findings also suggest that the fundamental limitations on the speed of operation of a bilayer resistive memory are the time- and voltage-dependences of the switch-on mechanism and not the switch-off process.
- Bioelectrical signal detection using conducting polymer electrodes and the displacement current methodPublication . Inácio, Pedro; Mestre, Ana L G; Medeiros, C.R.; Asgarifar, Sanaz; ELAMINE, Youssef; Canudo, Joana; Santos, João; Bragança, José; Morgado, Jorge; Biscarini, Fabio; Gomes, Henrique L.Conducting polymer electrodes based on poly (3, 4 ethylenedioxythiophene): polystyrene sulfonate were used to record electrophysiological signals from autonomous cardiac contractile cells present in embryoid bodies. Signal detection was carried out by measuring the displacement current across the polymer/electrolyte double-layer capacitance, and compared with voltage detection. While for relatively low capacitance electrodes, the voltage amplification provides higher signal quality, and for high capacitive electrodes, the displacement current method exhibits a higher signal-to-noise ratio. It is proposed that the displacement current method combined with high capacitive polymer-based electrodes is adequate to measure clusters of cells and whole organs. Our approach has a great potential in fundamental studies of drug discovery and safety pharmacology.
- Modeling electrical characteristics of thin-film field-effect transistors III. Normally-on devicesPublication . Stallinga, Peter; Gomes, Henrique L.The thin-film field-effect-transistor model recently developed is applied to devices based on materials that already show current even without a bias present at the gate resulting in so-called normally-on transistors. These fall in three categories: (i) narrow-band-gap semiconductors, where the thermal energy is sufficient to excite carriers across the band-gap, here analyzed for unipolar and ambipolar materials, (ii) doped semiconductors, and (iii) metals. It is shown what the impact is on the IV and transfer curves. (C) 2008 Elsevier B.V. All rights reserved.
- Electrical AC behaviour of MPCVD diamond Schottky diodesPublication . Pereira, L.; Rodrigues, A.; Gomes, Henrique L.; Pereira, E.The present work reports some experimental results on the electrical AC behaviour of metal-undoped diamond Schottky diodes fabricated with a free-standing MPCVD diamond film (5 mum thick). The metals are gold for the ohmic contact and aluminium for the rectifier. The capacitance and loss tangent vs, frequency shows that capacitance presents a relaxation maximum at frequencies near 10 kHz at room temperature. Although the simple model (small equivalent circuit) can justify the values for the relaxation, it cannot justify the departure from the Debye model, also verified in the Cole-Cole plot. Taking into account the existence of traps in the depletion region, a best fit to the experimental results was obtained. The difference between the Fermi level and the band edge of 0.2-0.3 eV is in agreement with the activation energy found from the loss tangent analysis. The capacitance with applied voltage (Mott-Schottky plots) gives a defect density of 10(16) cm(-3) with contact potentials near 0.5 V and the profile of defect density obtained shows a major density (approx. 10(17) cm(-3)) in a layer with a thickness less than 50 nm from the junction, decreasing by one order of magnitude with increasing distance. Finally a structural model is proposed to explain the AC behaviour found. (C) 2001 Elsevier Science B.V. All rights reserved.
- Photocurrents in P3MeT Schottky barrier diodesPublication . Jones, G. W.; Taylor, D. M.; Gomes, Henrique L.The photocurrent action spectrum of a Schottky diode formed from electrodeposited poly(3-methylthiophene) is shown to follow closely the UV-visible absorption spectrum. At low forward bias, the peak photocurrent asymptotes to the expected square-root dependence on total potential, V-t, across the depletion region. At high reverse bias the superlinear dependence of the photocurrent on V-t suggests that internal photoemission from the rectifying aluminium electrode may be the dominant process.
- Confocal scanning raman spectroscopy (CSRS) of an operating organic light-emitting diodePublication . Paez-Sierra, B. A.; Gomes, Henrique L.Organic molecules with semiconducting properties are becoming nowadays core of the organic-based electronic era. Although organic light emitting diodes (OLEDs) have already matured for commercial applications, they still require longer device lifetimes. Some of the long-standing challenges in OLED technology relay on degradation and failure mechanisms. Several authors observed that degradation and subsequent damage of OLEDs is accompanied by formation of dark non-emissive spots [1-2]. Implementation of the confocal scanning Raman spectroscopy (CSRS) measurements helps to understand the chemistry, physics of OLEDs and moreover to have better confidence on their quality assurance.
- Analysis of deep levels in a phenylenevinylene polymer by transient capacitance methodsPublication . Gomes, Henrique L.; Stallinga, Peter; Rost, H.; Holmes, A. B.; Harrison, M. G.; Friend, R. H.Transient capacitance methods were applied to the depletion region of an abrupt asymmetric n(+) -p junction of silicon and unintentionally doped poly[2-methoxy, 5 ethyl (2' hexyloxy) paraphenylenevinylene] (MEH-PPV). Studies in the temperature range 100-300 K show the presence of a majority-carrier trap at 1.0 eV and two minority traps at 0.7 and 1.3 eV, respectively. There is an indication for more levels for which the activation energy could not be determined. Furthermore, admittance data reveal a bulk activation energy for conduction of 0.12 eV, suggesting the presence of an additional shallow acceptor state. (C) 1999 American Institute of Physics. [S0003-6951(99)02308-6].
- Magnetic and transport properties of diluted granular multilayersPublication . Silva, Hugo G.; Gomes, Henrique L.; Pogorelov, Y. G.; Pereira, L. M. C.; Kakazei, G. N.; Sousa, J. B.; Araújo, J. P.; Mariano, José F. M. L.; Cardoso, S.; Freitas, P. P.The magnetic and transport properties of Co80Fe20t /Al2O34 nm multilayers with low nominal thicknesses t=0.7 and 0.9 nm of Co80Fe20 granular layers are studied. Magnetic studies find a superparamagnetic state above the blocking temperature Tb of field-cooled/zero-field-cooled splitting that grows with t and decreases with H. The low-voltage Ohmic tunnel transport passes to non-Ohmic IV3/2 law for applied fields above 500 V/cm. At fixed V, the temperature dependence of conductance reveals an anomalous dip around 220 K, which can be attributed to the effect of surface contamination by supercooled water. Current-in-plane tunnel magnetoresistance MR ratio tends, at lower t, to higher maximum values 8% at room temperature but to lower field sensitivity. This may indicate growing discorrelation effect e.g., between shrinking areas of correlated moments in this regime and corroborates the deficit of granule magnetization estimated from the Inoue–Maekawa MR fit, compared to that from direct magnetization measurements. MR displays a mean-field-like critical behavior when t approaches the point of superparamagnetic/ superferromagnetic transition tc1.3 nm at room temperature from below, different from the formerly reported percolationlike behavior at approaching it from above.With growing temperature, MR reveals, beyond the common decrease, an anomalous plateau from Tb30–50 K up to some higher value T150–200 K, not seen at higher t.